| July 1988 |
Raytex Corporation established in Hachioji City, Tokyo with JPY 3M initial capital. |
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| July 1990 |
Raytex begins sales of Chapman Non-Contact Surface Roughness Measurement Systems. |
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| May 1993 |
Raytex begins sales of E + H Wafer Profile Measurement Systems. |
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| Jan. 1994 |
Company headquarters moves to Kokubunji, Tokyo. |
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| June 1995 |
Company headquarters moves to Tama City, Tokyo. |
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| Dec. 1995 |
Raytex begins development of EdgeScan Wafer Edge Defect Automatic Inspection System. |
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| May 1996 |
Raytex begins sales of EdgeScan Wafer Edge Defect Automatic Inspection System (first phase of in-house technology development). |
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| March 1997 |
Raytex begins sales of Disk Surface Roughness Sensor (second phase of in-house technology development). |
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| Oct. 1997 |
Company headquarters moved to present location. |
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| Jan. 2001 |
Raytex concludes agreement with Seki Technotron, Inc. for comprehensive distributorship of Wafer Edge Defect Automatic Inspection System. |
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| April 2001 |
Raytex begins sales of BackScan Wafer Backside Automatic Inspection System (third phase of in-house technology development) |
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| July 2001 |
Raytex acquires distributorship rights to DynaSearch Wafer Topography Measurement Inspection System. |
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| July 2002 |
Raytex begins in-house development of DynaSearch Wafer Topography Measurement Inspection System. |
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| Jan. 2003 |
Raytex begins sales of Wafer Edge and Backside Combination Inspection System. |
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| March 2003 |
Raytex opens Fukushima branch office in Fukushima City, Fukushima Prefecture. |
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| June 2003 |
Raytex opens Fukuoka branch office in Fukuoka City, Fukuoka Prefecture. |
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| July 2003 |
Raytex begins sales of Chapman Film Thickness Measurement System and Ion Dose Monitor. |
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| Aug. 2003 |
Raytex USA Corporation established in Oregon, USA |
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| Oct. 2003 |
Raytex announces Wafer Full-Surface Inspection System designed for intermediate processes (fourth phase of in-house technology development). |
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| Oct. 2003 |
Raytex announces DynaSearch XP Wafer Topography Measurement Inspection System (in-house developed version). |
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| April 22, 2004 |
Raytex Corporation listed on Tokyo Stock Exchange, Motherfs Market. |
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| June 28, 2004 |
Raytex acquires patent and trademark rights to DynaSearch Wafer Topography Measurement Inspection System |
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| Aug. 19, 2004 |
Raytex opens Taiwan branch office in Taipei, Taiwan. |
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| Sept. 27, 2004 |
Raytex acquires patent and trademark rights to NanoPro NP1 Wafer Measurement Inspection System from KLA-Tencor Corporation. |
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| Oct. 1, 2004 |
Raytex begins sales of EdgeScan Plus Wafer Edge Defect Inspection System. |
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| Oct. 6, 2004 |
Raytex opens Korea branch office in Youngin City, Kyunggi-Do. |
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| May, 2005 |
Commenced sales of Wafer Edge/Backside Multi-Function Inspection System |
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| January 2006 |
Obtained ISO9001:2000 international certification of quality management system |
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| May 2006 |
Commenced sales of NanoPro NP1 Wafer Inspection System |
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| July 2006 |
New building construction completed in Tama Ochiai, Headquarters office relocated |
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| March 2007 |
NanoSystem Solutions, Inc. added as wholly-owned subsidiary through share exchange |
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| April 2007 |
Obtained patent and trademark rights to gWafer Internal Defect Inspection Systemh thought Mitsui Mining and Smelting Co., Ltd.
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